Products - Instruments

The Analyzers, LCR Meters, and DC Bias Models, Ohm meter, Interlayer Short Circuit Tester

Showing 1-9 of 18 Instruments
Impedance Analyzer
6500B Series

Impedance Analyzer

High-precision analyzers featuring a user-friendly graphical interface, high-resolution color display, 0.05% basic accuracy, a minimum frequency of 20Hz, and a maximum frequency of up to 120MHz.

High Frequency LCR Meter
6500P Series

High Frequency LCR Meter

The 6500P series LCR meters feature extended test frequencies, high accuracy, and a large, high-resolution color display.

High Frequency DC Bias
6565 Series

High Frequency DC Bias

The 6565 DC Bias Units are used to evaluate components at currents up to 80A and are compatible with the Wayne Kerr 6500B and 6500P models of precision analyzers.

Precision Component Analyzer
6400B Series

Precision Component Analyzer

The 6400 Series provides thorough and accurate testing of any passive component with market-leading accuracy.

High Current Test System LCR Meter
5400L Series

High Current Test System LCR Meter

High-current inductance testing systems with external DC bias up to 300A, 0.05% basic accuracy, a frequency range of 10Hz to 10MHz, and the capability for simultaneous multi-parameter measurements.

LCR Meters
4300 Series

LCR Meters

User-friendly LCR meters with extensive functions for accurate, fast measurements from 20Hz to 1MHz, ideal for various test and production environments.

DC Bias Current Unit
3265B Series

DC Bias Current Unit

Enable high current component evaluation with the Wayne Kerr 3255B Inductance Analyzer or 3260B Precision Magnetics Analyzer, offering bias current settings from 25mA to 25A in 25mA steps.

Precision Magnetics Analyzer
3260B Series

Precision Magnetics Analyzer

Provides comprehensive magnetic component analysis up to 3MHz, including true 4-terminal primary to secondary parameters, through 8 front panel BNCs.

Inductance Analyzer
3255B Series

Inductance Analyzer

Versatile and accurate inductance analyzers designed for straightforward device characterization.